{"id":151818,"date":"2005-05-01T00:00:00","date_gmt":"2005-05-01T00:00:00","guid":{"rendered":"https:\/\/www.microsoft.com\/en-us\/research\/msr-research-item\/static-analysis-tools-as-early-indicators-of-pre-release-defect-density\/"},"modified":"2018-10-16T21:50:21","modified_gmt":"2018-10-17T04:50:21","slug":"static-analysis-tools-as-early-indicators-of-pre-release-defect-density","status":"publish","type":"msr-research-item","link":"https:\/\/www.microsoft.com\/en-us\/research\/publication\/static-analysis-tools-as-early-indicators-of-pre-release-defect-density\/","title":{"rendered":"Static Analysis Tools as Early Indicators of Pre-Release Defect Density"},"content":{"rendered":"<div class=\"asset-content\">\n<p>During software development it is helpful to obtain early estimates of the defect density of software components. Such estimates identify fault-prone areas of code requiring further testing. We present an empirical approach for the early prediction of pre-release defect density based on the defects found using static analysis tools. The defects identified by two different static analysis tools are used to fit and predict the actual pre-release defect density for Windows Server 2003. We show that there exists a strong positive correlation between the static analysis defect density and the pre-release defect density determined by testing. Further, the predicted pre-release defect density and the actual pre-release defect density are strongly correlated at a high degree of statistical significance. Discriminant analysis shows that the results of static analysis tools can be used to separate high and low quality components with an overall classification rate of 82.91%.<\/p>\n<\/div>\n<p><!-- .asset-content --><\/p>\n","protected":false},"excerpt":{"rendered":"<p>During software development it is helpful to obtain early estimates of the defect density of software components. Such estimates identify fault-prone areas of code requiring further testing. We present an empirical approach for the early prediction of pre-release defect density based on the defects found using static analysis tools. The defects identified by two different [&hellip;]<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"msr-url-field":"","msr-podcast-episode":"","msrModifiedDate":"","msrModifiedDateEnabled":false,"ep_exclude_from_search":false,"_classifai_error":"","msr-author-ordering":[{"type":"user_nicename","value":"nachin","user_id":"33044"},{"type":"user_nicename","value":"tball","user_id":"33895"}],"msr_publishername":"Association for Computing Machinery, Inc.","msr_publisher_other":"","msr_booktitle":"","msr_chapter":"","msr_edition":"","msr_editors":"","msr_how_published":"","msr_isbn":"","msr_issue":"","msr_journal":"","msr_number":"","msr_organization":"","msr_pages_string":"","msr_page_range_start":"","msr_page_range_end":"","msr_series":"","msr_volume":"","msr_copyright":"Copyright \u00a9 2004 by the Association for Computing Machinery, Inc. Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, to republish, to post on servers, or to redistribute to lists, requires prior specific permission and\/or a fee. Request permissions from Publications Dept, ACM Inc., fax +1 (212) 869-0481, or permissions@acm.org. The definitive version of this paper can be found at ACM's Digital Library -http:\/\/www.acm.org\/dl\/.","msr_conference_name":"","msr_doi":"","msr_arxiv_id":"","msr_s2_paper_id":"","msr_mag_id":"","msr_pubmed_id":"","msr_other_authors":"Nachiappan Nagappan, Thomas 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