{"id":248330,"date":"2017-03-02T23:53:02","date_gmt":"2017-03-03T07:53:02","guid":{"rendered":"https:\/\/www.microsoft.com\/en-us\/research\/?post_type=msr-research-item&p=248330"},"modified":"2018-10-16T22:12:07","modified_gmt":"2018-10-17T05:12:07","slug":"multiview-rectification-folded-documents","status":"publish","type":"msr-research-item","link":"https:\/\/www.microsoft.com\/en-us\/research\/publication\/multiview-rectification-folded-documents\/","title":{"rendered":"Multiview Rectification of Folded Documents"},"content":{"rendered":"\n\n\n

\"\"<\/p>\n\n\n\n

Digitally unwrapping images of paper sheets is crucial for accurate document scanning and text recognition. This paper presents a method for automatically rectifying curved or folded paper sheets from a few images captured from multiple viewpoints. Prior methods either need expensive 3D scanners or model deformable surfaces using over-simplified parametric representations. In contrast, our method uses regular images and is based on general developable surface models that can represent a wide variety of paper deformations. Our main contribution is a new robust rectification method based on ridge-aware 3D reconstruction of a paper sheet and unwrapping the reconstructed surface using properties of developable surfaces via\u00a0<\/span><\/span>\\(\u2113_1\\)\u00a0<\/span>conformal mapping. We present results on several examples including book pages, folded letters and shopping receipts.<\/span><\/p>\n","protected":false},"excerpt":{"rendered":"

Digitally unwrapping images of paper sheets is crucial for accurate document scanning and text recognition. This paper presents a method for automatically rectifying curved or folded paper sheets from a few images captured from multiple viewpoints. Prior methods either need expensive 3D scanners or model deformable surfaces using over-simplified parametric representations. In contrast, our method […]<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"msr-url-field":"","msr-podcast-episode":"","msrModifiedDate":"","msrModifiedDateEnabled":false,"ep_exclude_from_search":false,"_classifai_error":"","msr-author-ordering":[{"type":"text","value":"Shaodi You","user_id":0},{"type":"text","value":"Yasuyuki Matsushita","user_id":0},{"type":"user_nicename","value":"sudipsin","user_id":"33748"},{"type":"text","value":"Yusuke Bou","user_id":0},{"type":"text","value":"Katsushi Ikeuchi","user_id":0}],"msr_publishername":"IEEE","msr_publisher_other":"","msr_booktitle":"","msr_chapter":"","msr_edition":"","msr_editors":"","msr_how_published":"","msr_isbn":"","msr_issue":"","msr_journal":"IEEE Transactions on Pattern Analysis and Machine 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