{"id":442668,"date":"2017-11-27T08:58:12","date_gmt":"2017-11-27T16:58:12","guid":{"rendered":"https:\/\/www.microsoft.com\/en-us\/research\/?post_type=msr-research-item&#038;p=442668"},"modified":"2018-10-16T20:01:50","modified_gmt":"2018-10-17T03:01:50","slug":"texture-analysis-coated-conductors-micro-raman-synchrotron-x-ray-diffraction","status":"publish","type":"msr-research-item","link":"https:\/\/www.microsoft.com\/en-us\/research\/publication\/texture-analysis-coated-conductors-micro-raman-synchrotron-x-ray-diffraction\/","title":{"rendered":"Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction"},"content":{"rendered":"<p>Two novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (\u03bc-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 \u03bcm spatial resolution and acquisition times of 5 min\/spot. In addition, synchrotron x-ray diffraction analysis in transmission geometry and 2D detectors enables, with acquisition times of 100 ms, simultaneous observation of a- and c- crystallites and in-plane textures of substrates, buffers and superconducting layer. Thus, opening the field of this technique to in-situ analysis of epitaxial growth of coated conductors prepared by ex-situ processes. Results from these two techniques for stainless steel tapes buffered with IBAD-YSZ and coated with PLD-YBCO are analyzed.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Two novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (\u03bc-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 \u03bcm spatial resolution and acquisition times of 5 min\/spot. In addition, synchrotron x-ray diffraction [&hellip;]<\/p>\n","protected":false},"featured_media":0,"template":"","meta":{"msr-url-field":"","msr-podcast-episode":"","msrModifiedDate":"","msrModifiedDateEnabled":false,"ep_exclude_from_search":false,"_classifai_error":"","msr-author-ordering":null,"msr_publishername":"","msr_publisher_other":"","msr_booktitle":"","msr_chapter":"","msr_edition":"","msr_editors":"","msr_how_published":"","msr_isbn":"","msr_issue":"","msr_journal":"Mat. Res. Soc. Symp.","msr_number":"","msr_organization":"","msr_pages_string":"","msr_page_range_start":"","msr_page_range_end":"","msr_series":"","msr_volume":"659","msr_copyright":"","msr_conference_name":"","msr_doi":"10.1557\/PROC-659-II5.6","msr_arxiv_id":"","msr_s2_paper_id":"","msr_mag_id":"","msr_pubmed_id":"","msr_other_authors":"","msr_other_contributors":"","msr_speaker":"","msr_award":"","msr_affiliation":"","msr_institution":"","msr_host":"","msr_version":"","msr_duration":"","msr_original_fields_of_study":"","msr_release_tracker_id":"","msr_s2_match_type":"","msr_citation_count_updated":"","msr_published_date":"2001-01-09","msr_highlight_text":"","msr_notes":"","msr_longbiography":"","msr_publicationurl":"https:\/\/www.researchgate.net\/publication\/313405514_Texture_analysis_of_coated_conductors_by_Micro-Raman_and_synchrotron_x-ray_diffraction","msr_external_url":"","msr_secondary_video_url":"","msr_conference_url":"","msr_journal_url":"","msr_s2_pdf_url":"","msr_year":0,"msr_citation_count":0,"msr_influential_citations":0,"msr_reference_count":0,"msr_s2_match_confidence":0,"msr_microsoftintellectualproperty":true,"msr_s2_open_access":false,"msr_s2_author_ids":[],"msr_pub_ids":[],"msr_hide_image_in_river":0,"footnotes":""},"msr-research-highlight":[],"research-area":[13556],"msr-publication-type":[193715],"msr-publisher":[],"msr-focus-area":[],"msr-locale":[268875],"msr-post-option":[],"msr-field-of-study":[],"msr-conference":[],"msr-journal":[],"msr-impact-theme":[],"msr-pillar":[],"class_list":["post-442668","msr-research-item","type-msr-research-item","status-publish","hentry","msr-research-area-artificial-intelligence","msr-locale-en_us"],"msr_publishername":"","msr_edition":"","msr_affiliation":"","msr_published_date":"2001-01-09","msr_host":"","msr_duration":"","msr_version":"","msr_speaker":"","msr_other_contributors":"","msr_booktitle":"","msr_pages_string":"","msr_chapter":"","msr_isbn":"","msr_journal":"Mat. Res. Soc. Symp.","msr_volume":"659","msr_number":"","msr_editors":"","msr_series":"","msr_issue":"","msr_organization":"","msr_how_published":"","msr_notes":"","msr_highlight_text":"","msr_release_tracker_id":"","msr_original_fields_of_study":"","msr_download_urls":"","msr_external_url":"","msr_secondary_video_url":"","msr_longbiography":"","msr_microsoftintellectualproperty":1,"msr_main_download":"","msr_publicationurl":"https:\/\/www.researchgate.net\/publication\/313405514_Texture_analysis_of_coated_conductors_by_Micro-Raman_and_synchrotron_x-ray_diffraction","msr_doi":"10.1557\/PROC-659-II5.6","msr_publication_uploader":[{"type":"url","title":"https:\/\/www.researchgate.net\/publication\/313405514_Texture_analysis_of_coated_conductors_by_Micro-Raman_and_synchrotron_x-ray_diffraction","viewUrl":false,"id":false,"label_id":0},{"type":"doi","title":"10.1557\/PROC-659-II5.6","viewUrl":false,"id":false,"label_id":0}],"msr_related_uploader":"","msr_citation_count":0,"msr_citation_count_updated":"","msr_s2_paper_id":"","msr_influential_citations":0,"msr_reference_count":0,"msr_arxiv_id":"","msr_s2_author_ids":[],"msr_s2_open_access":false,"msr_s2_pdf_url":null,"msr_attachments":[{"id":0,"url":"https:\/\/www.researchgate.net\/publication\/313405514_Texture_analysis_of_coated_conductors_by_Micro-Raman_and_synchrotron_x-ray_diffraction"}],"msr-author-ordering":[{"type":"text","value":"Teresa Puig","user_id":0,"rest_url":false},{"type":"text","value":"Anna Puig Molina","user_id":0,"rest_url":false},{"type":"text","value":"Narcis Mestres","user_id":0,"rest_url":false},{"type":"user_nicename","value":"havansei","user_id":36656,"rest_url":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/microsoft-research\/v1\/researchers?person=havansei"},{"type":"text","value":"Francesc Alzina","user_id":0,"rest_url":false},{"type":"text","value":"Juan Carlos Gonzalez","user_id":0,"rest_url":false},{"type":"text","value":"Xavier Obradors","user_id":0,"rest_url":false},{"type":"text","value":"H. Graafsma","user_id":0,"rest_url":false},{"type":"text","value":"Alexander Usoskin","user_id":0,"rest_url":false},{"type":"text","value":"H.C. Freyhardt","user_id":0,"rest_url":false}],"msr_impact_theme":[],"msr_research_lab":[],"msr_event":[],"msr_group":[663258],"msr_project":[],"publication":[],"video":[],"msr-tool":[],"msr_publication_type":"article","related_content":[],"_links":{"self":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/442668","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item"}],"about":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/types\/msr-research-item"}],"version-history":[{"count":2,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/442668\/revisions"}],"predecessor-version":[{"id":442755,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-item\/442668\/revisions\/442755"}],"wp:attachment":[{"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/media?parent=442668"}],"wp:term":[{"taxonomy":"msr-research-highlight","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-research-highlight?post=442668"},{"taxonomy":"msr-research-area","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/research-area?post=442668"},{"taxonomy":"msr-publication-type","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-publication-type?post=442668"},{"taxonomy":"msr-publisher","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-publisher?post=442668"},{"taxonomy":"msr-focus-area","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-focus-area?post=442668"},{"taxonomy":"msr-locale","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-locale?post=442668"},{"taxonomy":"msr-post-option","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-post-option?post=442668"},{"taxonomy":"msr-field-of-study","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-field-of-study?post=442668"},{"taxonomy":"msr-conference","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-conference?post=442668"},{"taxonomy":"msr-journal","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-journal?post=442668"},{"taxonomy":"msr-impact-theme","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-impact-theme?post=442668"},{"taxonomy":"msr-pillar","embeddable":true,"href":"https:\/\/www.microsoft.com\/en-us\/research\/wp-json\/wp\/v2\/msr-pillar?post=442668"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}